Advanced Cantilever Multi-site Solutions
Our multi-site probe card is a proven solution for both logic, analog, LCD, CIS, memory and other testing.
- We are capable of building probe cards up to 256 sites with probe count exceeding 3000 probes;
- We are capable for building multi-site probe cards with large array sizes and flexible configurations;
- We simulate the physical probe card building through 2D & 3D model, professional probe card design and numerical analysis design software, which could guarantee the precision and efficiency of the probe card.
- Diagonal: 1×4 ,1×8, 1×16
- Shelf: 1×2, 2×2, up to 1×12 in-line
- Multi-die, Memory/CIS Device, 32DUT, 64DUT, 128DUT, 256DUT