Advanced Cantilever High Speed Solutions

Probe cards are used in the testing of Integrated Circuit, Photoelectric Chip, Sensors, Electronic Components, Hybrid Circuit and other testing applications.

Advanced Cantilever High Speed Solutions

High Frequency (RF) probe cards

The continuous IC evolution pushes the semiconductor device to overcome it’s performance limitations. High Frequency/High speed devices could define the test capability of next ATE generation. The close interconnection between DUT and the tester is represented by probe card and its tester interface.

We utilise a variety of advanced design and manufacturing process, adopting special shielding technology and material, to guarantee the stable signal transmission.

Cantilever build:  Frequency up to 3.5GHz

VS Build: Frequency up to 4.0GHz

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