Advanced Cantilever High Speed Solutions
High Frequency (RF) probe cards
The continuous IC evolution pushes the semiconductor device to overcome it’s performance limitations. High Frequency/High speed devices could define the test capability of next ATE generation. The close interconnection between DUT and the tester is represented by probe card and its tester interface.
We utilise a variety of advanced design and manufacturing process, adopting special shielding technology and material, to guarantee the stable signal transmission.
Cantilever build: Frequency up to 3.5GHz
VS Build: Frequency up to 4.0GHz